Dr. Jennifer Decker on Measurement, Standards and Nanotechnology (Breakfast Seminar followed by AGM)
Post date: Nov 17, 2010 7:57:29 PM
Dr Decker will discuss the importance of measurement science and metrology as essential for nanoscale manufacturing of new materials, devices and products. An important precursor to trading nanotechnology products is the demonstration of product safety as regards human health and the environment. Reliable detection and characterization of nanomaterials is imperative for our understanding in the study of their toxicological behaviours and to draw conclusions that attain global agreement. Nanotechnology poses a unique challenge in this regard because many of the tools currently used in the lab are difficult to transfer to the shop floor.
Please note that our AGM will take place at approximately 9 am on Dec 14th, immediately following the breakfast seminar. Members are encouraged to attend the AGM. Interested non-members are also welcome.
About the Speaker:
Jennifer E Decker received her PhD in Physics from Laval University, Québec in 1992 and subsequently joined the Institute for National Measurement Standards (INMS) of the National Research Council of Canada (NRC). She is Team Leader, Metrology for Nanotechnology with research interests in length measurement & calibration and uncertainty evaluation. She chairs the Canadian Mirror Committee to ISO/TC229: Nanotechnologies Working Group 2: Measurement and Characterization.
Tuesday December 14, 2010
7:30 am (7:45 full breakfast)
The Metropolitan Brasserie (Sussex and Rideau)
Valerie Douglas, firstname.lastname@example.org, (613) 248-3333
AWMA Members $25 ($30 after Dec 12)
Non-Members $30 ($35 after Dec 12)
Student Members $10, Student Non-Members $15.
Online payment now available. Note: you do not need to RSVP separately if you are paying online.